Fault Diagnosis of Analog Integrated Circuits

Prithviraj Kabisatpathy, Alok Barua, Satyabroto Sinha

• Paperback | Engels | Frontiers in Electronic Testing | nr. 30
• Fault Diagnosis of Analog Integrated Circuits is a textbook for advanced undergraduate and graduate level students as well as practicing engineers. Th... Lees meer

Multi-Chip Module Test Strategies

• Paperback | Engels | Frontiers in Electronic Testing | nr. 7
• MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cos... Lees meer

Efficient Branch and Bound Search with Application to Computer-Aided Design

Xinghao Chen, Michael L Bushnell

• Hardcover | Engels | Frontiers in Electronic Testing | nr. 4
• Branch-and-bound search has been known for a long time and has been widely used in solving a variety of problems in computer-aided design (CAD) and ma... Lees meer

Embedded Processor-Based Self-Test

Dimitris Gizopoulos, A Paschalis, Yervant Zorian

• Hardcover | Engels | Frontiers in Electronic Testing | nr. 28
• Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most... Lees meer

Data Mining and Diagnosing IC Fails

Leendert M Huisman

• Paperback | Engels | Frontiers in Electronic Testing | nr. 31
• There are many techniques for analyzing IC fails, but they are scattered over the professional IC test and diagnosis literature, and in various statis... Lees meer

Advances in Electronic Testing

• Hardcover | Engels | Frontiers in Electronic Testing | nr. 27
• This new volume in the Frontiers in Electronic Testing book series is devoted to recent advances in electronic circuits testing. The book is a compreh... Lees meer

Introduction to Advanced System-On-Chip Test Design and Optimization

Erik Larsson

• Hardcover | Engels | Frontiers in Electronic Testing | nr. 29
• SOC test design and its optimization is the topic of this book, and the aim is to give an introduction to testing, describe the problems related to SO... Lees meer

Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation

• Paperback | Engels | Frontiers in Electronic Testing | nr. 23
• Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation intends to be a comprehensive guide to Fault Injection techniques use... Lees meer

Test Resource Partitioning for System-On-A-Chip

Vikram Iyengar, Anshuman Chandra

• Hardcover | Engels | Frontiers in Electronic Testing | nr. 20
• Test Resource Partitioning for System-on-a-Chip is about test resource partitioning and optimization techniques for plug-and-play system-on-a-chip (SO... Lees meer

On-Line Testing for VLSI

• Hardcover | Engels | Frontiers in Electronic Testing | nr. 11
• Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended func... Lees meer

The Core Test Wrapper Handbook

Francisco Da Silva, Teresa McLaurin, Tom Waayers

• Paperback | Engels | Frontiers in Electronic Testing | nr. 35
• In the early to mid-1990's while working at what was then Motorola Se- conductor, business changes forced my multi-hundred dollar microprocessor to be... Lees meer

High Performance Memory Testing

R Dean Adams

• Hardcover | Engels | Frontiers in Electronic Testing | nr. 22
• Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bi... Lees meer

Boundary-Scan Interconnect Diagnosis

José T de Sousa, Peter Y K Cheung

• Paperback | Engels | Frontiers in Electronic Testing | nr. 18
• Boundary-Scan Interconnect Diagnosis explains how to synthesize digital diagnostic sequences for wire interconnects using boundary-scan, and how to as... Lees meer

Elements of Stil

Gregory A Maston, Tony R Taylor, Julie N Villar

• Paperback | Engels | Frontiers in Electronic Testing | nr. 24
• Standard - Test In. terface ____________________ Language So I was wrong. I was absolutely sure that by having an IEEE Standard defined, reviewed, and... Lees meer

Oscillation-Based Test in Mixed-Signal Circuits

Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, Jose Luis Huertas Díaz

• Hardcover | Engels | Frontiers in Electronic Testing | nr. 36
• Oscillation-Based Test in Mixed-Signal Circuits presents the development and experimental validation of the structural test strategy called Oscillatio... Lees meer

Introduction to Iddq Testing

S Chakravarty, Paul J Thadikaran

• Paperback | Engels | Frontiers in Electronic Testing | nr. 8
• Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a ... Lees meer

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Manoj Sachdev, José Pineda de Gyvez

• Paperback | Engels | Frontiers in Electronic Testing | nr. 34
• This book is essential to understand new test methodologies, algorithms and industrial practices. Without its insight into the physics of nano-metric ... Lees meer

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

M Bushnell, Vishwani Agrawal

• Hardcover | Engels | Frontiers in Electronic Testing | nr. 17
• The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, ... Lees meer

Soft Errors in Modern Electronic Systems

• Paperback | Engels | Frontiers in Electronic Testing | nr. 41
• Provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and miti... Lees meer

Elements of Stil

Gregory A Maston, Tony R Taylor, Julie N Villar

• Hardcover | Engels | Frontiers in Electronic Testing | nr. 24
• Standard - Test In. terface ____________________ Language So I was wrong. I was absolutely sure that by having an IEEE Standard defined, reviewed, and... Lees meer

Testability Concepts for Digital ICS

F P M Beenker, R G Bennetts, A P Thijssen

• Paperback | Engels | Frontiers in Electronic Testing | nr. 3
• Preface Testing Integrated Circuits for manufacturing defects includes four basic disciplines. First of all an understanding of the origin and behavio... Lees meer

Multi-Chip Module Test Strategies

• Hardcover | Engels | Frontiers in Electronic Testing | nr. 7
• MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cos... Lees meer

Timing Performance of Nanometer Digital Circuits Under Process Variations

Victor Champac, Jose Garcia Gervacio

• Paperback | Engels | Frontiers in Electronic Testing | nr. 39
• This book discusses the digital design of integrated circuits under process variations, with a focus on design-time solutions. The authors describe a ... Lees meer

Introduction to Advanced System-On-Chip Test Design and Optimization

Erik Larsson

• Paperback | Engels | Frontiers in Electronic Testing | nr. 29
• SOC test design and its optimization is the topic of this book, and the aim is to give an introduction to testing, describe the problems related to SO... Lees meer