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- Afhalen na 1 uur in een winkel met voorraad
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Resultaten voor "Manoj Sachdev"
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Esd Protection Device and Circuit Design for Advanced CMOS Technologies
Oleg Semenov, Hossein Sarbishaei, Manoj Sachdev
- Hardcover | Engels
- ESD Protection Device and Circuit Design for Advanced CMOS Technologies is intended for practicing engineers working in the areas of circuit design, V... Lees meer
€ 195,95Levering 1 à 2 weken€ 195,95Levering 1 à 2 weken -
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Manoj Sachdev, José Pineda de Gyvez
- Paperback | Engels | Frontiers in Electronic Testing | nr. 34
- The 2 nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Ana... Lees meer
€ 181,95Levering 1 à 2 weken€ 181,95Levering 1 à 2 weken -
Esd Protection Device and Circuit Design for Advanced CMOS Technologies
Oleg Semenov, Hossein Sarbishaei, Manoj Sachdev
- Paperback | Engels
- Dedication. Preface. Acknowledgments. 1. INTRODUCTION. 1. Nature of ESD phenOmena. 2. ESD failures in nanometric technologies. 3. Circuit reliability:... Lees meer
€ 180,98Levering 1 à 4 weken€ 180,98Levering 1 à 4 weken -
Thermal and Power Management of Integrated Circuits
Arman Vassighi, Manoj Sachdev
- Paperback | Engels | Integrated Circuits and Systems
- Power, Junction Temperature, and Reliability.- Burn-in as a Reliability Screening Test.- Thermal and Electrothermal Modeling.- Thermal Runaway and The... Lees meer
€ 167,95Levering 1 à 4 weken€ 167,95Levering 1 à 4 weken -
CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies
Andrei Pavlov, Manoj Sachdev
- Hardcover | Engels | Frontiers in Electronic Testing | nr. 40
- The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design consid... Lees meer
€ 181,95Levering 1 à 2 weken€ 181,95Levering 1 à 2 weken -
Thermal and Power Management of Integrated Circuits
Arman Vassighi, Manoj Sachdev
- Hardcover | Engels | Integrated Circuits and Systems
- In Thermal and Power Management of Integrated Circuits , power and thermal management issues in integrated circuits during normal operating conditions... Lees meer
€ 153,95Levering 1 à 2 weken€ 153,95Levering 1 à 2 weken -
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Manoj Sachdev, José Pineda de Gyvez
- Hardcover | Engels | Frontiers in Electronic Testing | nr. 34
- The 2 nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Ana... Lees meer
€ 279,45Levering 1 à 2 weken€ 279,45Levering 1 à 2 weken
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