Advances in X-Ray Analysis

• Hardcover | Engels | Advances in X-Ray Analysis | nr. 33
• The 38th Annual Denver Conference on Applications of X-Ray Analysis was held July 31 - August 4, 1989, at the Sheraton Denver Technical Center, Denver... Lees meer

Advances in X-Ray Analysis

• Hardcover | Engels | Advances in X-Ray Analysis | nr. 32
• The 37th Annual Denver Conference on Applications of X-Ray Analysis was held August 1-5, 1988, at the Sheraton Steamboat Resort and Conference Center,... Lees meer

Advances in X-Ray Analysis

William M Mueller

• Paperback | Engels | Advances in X-Ray Analysis | nr. 5
• The text of this volume had its origin in the Tenth Annual Conference on Applications of X-Ray Analysis sponsored by the University of Denver and held... Lees meer

Advances in X-Ray Analysis

Jerome B Cohen

• Hardcover | Engels | Advances in X-Ray Analysis | nr. 27
• This volume constitutes the proceedings of the 1983 Denver Conference on Applications of X-ray Analysis and is the 27th in the series. The conference ... Lees meer

Advances in X-Ray Analysis

Charles S Barrett

• Hardcover | Engels | Advances in X-Ray Analysis | nr. 30
• The 35th Annual Denver Conference on Applications of X-Ray Analysis was held August 4-8, 1986, on the campus of the University of Denver. Since the pr... Lees meer

Advances in X-Ray Analysis

• Hardcover | Engels | Advances in X-Ray Analysis | nr. 29
• The 37th Annual Denver Conference on Applications of X-Ray Analysis was held August 1-5, 1988, at the Sheraton Steamboat Resort and Conference Center,... Lees meer

Advances in X-Ray Analysis

Gilfrich

• Hardcover | Engels | Advances in X-Ray Analysis | nr. 36
• Mathematical Techniques in XRay Spectrometry: Research in the Quantitative Analysis of Individual Particles by XRay Fluorescence Spectrometry (M. Lank... Lees meer

Advances in X-Ray Analysis

I C Noyan, Gilfrich

• Hardcover | Engels | Advances in X-Ray Analysis | nr. 37
• 89 articles organized under the following section heads: Impact of Computers on Xray Analysis. Applications of Whole Pattern Fitting: Structure Determ... Lees meer

Advances in X-Ray Analysis

• Hardcover | Engels | Advances in X-Ray Analysis | nr. 35
• Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Su... Lees meer

Advances in X-Ray Analysis

• Hardcover | Engels | Advances in X-Ray Analysis | nr. 34
• The 39th Annual Denver X-Ray Conference on Applications of X-Ray Analysis was held July 30 -August 3, 1990, at the Sheraton Steamboat Resort and Confe... Lees meer

Advances in X-Ray Analysis

Conference on Applications of X-Ray Analysis

• Hardcover | Engels | Advances in X-Ray Analysis | nr. 23
• Traditionally the emphasis at each annual Denver X-ray Con- ference is placed on a particular aspect of X-ray analysis. The past decade has seen a ste... Lees meer

Advances in X-Ray Analysis

• Hardcover | Engels | Advances in X-Ray Analysis | nr. 28
• The 33rd Annual Denver Conference on Applications of X-Ray Analysis was held July 30-August 3. 1984. on the campus of the University of Denver. Follow... Lees meer