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- Ruim aanbod met 7 miljoen producten
Radar Scattering and Imaging of Rough Surfaces
Modeling and Applications with Matlab(r)
Kun-Shan Chen
€ 72,95
+ 145 punten
Omschrijving
Radar scattering and imaging of rough surfaces is an active interdisciplinary area of research with many practical applications in fields such as mineral and resource exploration, ocean and physical oceanography, military and national defense, planetary exploration, city planning and land use, environmental science, and many more. By focusing on the most advanced analytical and numerical modeling and describing both forward and inverse modeling, Radar Scattering and Imaging of Rough Surfaces: Modeling and Applications with MATLAB(R) connects the scattering process to imaging techniques by vivid examples through numerical and experimental demonstrations and provides computer codes and practical uses. This book is unique in its simultaneous treatment of radar scattering and imaging.
Key Features
- Bridges physical modeling with simulation for resolving radar imaging problems (the first comprehensive work to do so)
- Provides excellent basic and advanced information for microwave remote-sensing professionals in various fields of science and engineering
- Covers most advanced analytical and numerical modeling for both backscattering and bistatic scattering
- Includes MATLAB(R) codes useful not only for academics but also for radar engineers and scientists to develop tools applicable in different areas of earth studies
Covering both the theoretical and the practical, Radar Scattering and Imaging of Rough Surfaces: Modeling and Applications with MATLAB(R) is an invaluable resource for professionals and students using remote sensing to study and explain the Earth and its processes. University and research institutes, electrical and radar engineers, remote-sensing image users, application software developers, students, and academics alike will benefit from this book.
The author, Kun-Shan Chen, is an internationally known and respected engineer and scientist and an expert in the field of electromagnetic modeling.
Specificaties
Betrokkenen
- Auteur(s):
- Uitgeverij:
Inhoud
- Aantal bladzijden:
- 323
- Taal:
- Engels
- Reeks:
Eigenschappen
- Productcode (EAN):
- 9780367627997
- Verschijningsdatum:
- 31/05/2023
- Uitvoering:
- Paperback
- Formaat:
- Trade paperback (VS)
- Afmetingen:
- 156 mm x 233 mm
- Gewicht:
- 559 g
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