Standaard Boekhandel gebruikt cookies en gelijkaardige technologieën om de website goed te laten werken en je een betere surfervaring te bezorgen.
Hieronder kan je kiezen welke cookies je wilt inschakelen:
Technische en functionele cookies
Deze cookies zijn essentieel om de website goed te laten functioneren, en laten je toe om bijvoorbeeld in te loggen. Je kan deze cookies niet uitschakelen.
Analytische cookies
Deze cookies verzamelen anonieme informatie over het gebruik van onze website. Op die manier kunnen we de website beter afstemmen op de behoeften van de gebruikers.
Marketingcookies
Deze cookies delen je gedrag op onze website met externe partijen, zodat je op externe platformen relevantere advertenties van Standaard Boekhandel te zien krijgt.
Je kan maximaal 250 producten tegelijk aan je winkelmandje toevoegen. Verwijdere enkele producten uit je winkelmandje, of splits je bestelling op in meerdere bestellingen.
To utilize the full potential of modern composite materials, new and innovative inspection methods are required to detect and classify defects, which are critical to the mechanical properties of the components. Ideally, such methods are non-contact, non-destructive, and can be applied during the manufacturing process, as well as during the complete lifespan of the components. Measurement systems based on millimeter waves meet these requirements, however, so far, such technologies are not used in an industrial environment, despite their potential of increasing the quality and efficiency of composite materials. Based on the propagation properties of millimeter waves, interacting with composite materials, the capabilities of such millimeter-wave-based measurement systems are investigated. Various measurement systems, operating at different frequency ranges within the millimeter wave spectrum, are developed to demonstrate the capabilities of such systems. This includes various signal-processing methods to provide an optimized evaluation of the measured signals, enabling high-resolution, non-destructive, and non-contact tomographic measurements with the presented measurement technology.